Manual Probe Station

  1. Manual Probe Station
SJD AK-200 8-inch Manual Probe Station

SJD AK-200 8-inch Manual Probe Station

SJD AK-200 8-inch manual probe station offers enhanced versatility for testing larger semiconductor devices, precise manual control for accurate probe placement and a robust design that accommodates various testing environments, supports up to 8-inch wafers.
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  • AK-200.jpg
  • AK-200 3.jpg
  • AK-200 2.jpg
  • AK-200 1.jpg
DETAIL
AK Series Manual Probe Station
SJD AK-200 8-inch Manual Probe Station 200mm

- 8 inch manual probe station
- Thermal Chuck system ‐40°C, 200°C (Option)
- DC/CV/RF probe (Option)
- Low leakage/High frequency measurement
- Vibration system (Option)
- CDA/Vacuum system (Option)
 

If you require a datasheet, please click the link below and fill out the contact form.

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