Semi-Auto Probe Station

  1. Semi-Auto Probe Station
Japan APOLLOWAVE Semi-automated Probe Station AP-300

Japan APOLLOWAVE Semi-automated Probe Station AP-300

AP-300 12-inch semi-automated probe station features motorized stage control, programmable testing capabilities, precise probe alignment, and support for up to 12-inch wafers, offering a versatile platform for high-precision semiconductor testing and characterization.
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  • 12-inch semi-auto probe station a300.jpg
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DETAIL
Japan APOLLOWAVE Semi-automated Probe Systems AP-300

- Temperature characteristic evaluation from -60°C to +350°C

- Probe solution for high-power devices. 20kV DC/200A

- Has a compact shield to prevent dew condensation

- The compact shield provides a low noise environment

- Probe station equipped with APOLLOWAVE proprietary software realizes high test efficiency

- By image recognition, automatic wafer alignment and automatic chip alignment are possible

If you require a datasheet, please click the link below and fill out the contact form.

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