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Japan APOLLOWAVE Semi-automated Probe Station AP-200
AP-200 8-inch semi-automated probe station features motorized stage movement for precise alignment, programmable testing capabilities for efficient workflows, high-resolution optical viewing systems and the ability to accommodate up to 8-inch wafers.
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DETAIL
JAPAN APOLLOWAVE SEMI-AUTOMATED PROBE SYSTEMS AP-200
- Temperature characteristic evaluation from -60°C to +350°C
- Probe solution for high-power devices. 20kV DC/200A
- Has a compact shield to prevent dew condensation
- The compact shield provides a low noise environment
- Probe station equipped with APOLLOWAVE proprietary software realizes high test efficiency
- By image recognition, automatic wafer alignment and automatic chip alignment are possible
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