Semi-Auto Probe Station

  1. Semi-Auto Probe Station
SJD AKS-200 8-inch Semi-automated Probe Station

SJD AKS-200 8-inch Semi-automated Probe Station

SJD AKS-200 8-inch semi-automated probe station offers precise wafer testing with semi-automated control, supporting wafers up to 8 inches. Features high-precision probing, a user-friendly interface and flexibility for high-power, high-frequency and high-temperature applications.
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DETAIL
AKS Series Semi-automated Probe Station
SJD AKS-200 8-inch Semi-automated Probe Station 200mm

- 8 inch semi-automated probe station
- Accommodate ‐40°C to 200°C measurement
- Accommodate the high power measurement 3kV and 200A
- Used for IV/CV/RF measurement
- Patented Anti ArcTech® technology, the world’s first and only pioneering anti arc solution
- High power vacuum chuck and high voltage and high current probe sets
- Leveraging the GPIB interface for instrument communication and testing automation
- Advanced software integration and intuitive user interface can easily navigate through functions and settings
- Vibration system (Option)
- CDA/Vacuum system (Option)

If you require a datasheet, please click the link below and fill out the contact form.

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