Manual Probe Station

  1. Manual Probe Station
SJD AK-DS-200 Double-Side Probe Station

SJD AK-DS-200 Double-Side Probe Station

SJD AK-DS-200 double-side probe station enables simultaneous top and bottom wafer probing for precise measurements.
AK-DS-200.png
/
DETAIL
AK Series Manual Probe Station
SJD AK-DS-200 Double-Side Probe Station

- With DUT holder platen and 2 layers probing platen
- XY movement 200mm x 200mm, Z travel 60mm
- Manipulator for holding Microscope, CCD and LED Light
- Designed to maintain high alignment accuracy and stability
- Able to used for a variety of semiconductor devices, such as power devices, RF components and MEMS
 

If you require a datasheet, please click the link below and fill out the contact form.

Back