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The Probe Card for High Power Measurement handles over 10 kV and 200 A, prevents high voltage discharge, uses iridium needles for high current support, connects to various measuring instruments and is suitable for both development and mass production lines.

The parametric probe card enables measurements under low and high temperatures (-55°C to 200°C), can measure low currents (<10 fA), and is compatible with Agilent 4060, 4070, and 4080 models.

A thermal chuck offers precise temperature control for semiconductor testing with a flat.

MJ-8 MJ-10 vacuum probe station provides a sealed environment to reduce contamination, precise probe alignment and controlled conditions.

MBP-55 Compact Desktop Prober is an integrated, lightweight device optimized for chip-level IV/CV measurements, supporting sample sizes up to 50 mm, and capable of measuring low-level current IV, capacitance CV, and RF, all while being easily portable.