All PRODUCT

A metallographic microscope is designed for high-resolution observation of metal surfaces, specialized optics for examining polished or etched samples, and the ability to analyze material structures at various magnifications.

A coaxial probe arm ensures precise electrical contact and measurements by featuring a central conductor with an outer shield to minimize interference and provide accurate signal transmission for semiconductor and RF device testing.

A triaxial probe arm is built for precise electrical measurements, using three conductive layers to reduce noise and improve signal quality for testing sensitive semiconductor devices and high-frequency applications.

M60 micromanipulator for high-frequency probes provides precise positioning and fine adjustments for accurate probe alignment.

M40 micromanipulator provides precise positioning and fine adjustments for accurate probe alignment.

M30 micromanipulator provides precise positioning and fine adjustments for accurate probe alignment.

M20 micromanipulator provides precise positioning and fine adjustments for accurate probe alignment.

Cantilever type with xcellent cost performance

Probe cards for low current and high temperature measurements

Use coaxial probe to achieve superior high frequency characteristics

The DC Multi-contact Probe can be installed in the same positioner as the high-frequency probe, supports random pin pitch with LCR chip parts mounted near the device for oscillation countermeasures, accommodates up to 20 pins, and can be made with tungsten, BeCu, Pd, or Ir needles.