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The 4284A is a 1 MHz LCR Meter from Agilent. An LCR meter is a piece of electronic test equipment that measures inductance (L), capacitance (C), and resistance (R) of electronic components. The LCR meter accurately measures these elements on an electronic device, usually one subjected to an alternating current (AC) voltage source. The LCR meter measures the current through and voltage across the device under test.

Alpha100 4-inch manual probe station offers precise manual probe control, a stable platform for accurate alignment, and support for up to 4-inch wafers, making it suitable for cost-effective semiconductor testing and research applications.

Alpha150 6-inch manual probe station allows researchers to perform precise electrical testing on larger semiconductor devices while maintaining hands-on control for optimal probe placement and alignment and support for up to 6-inch wafers.

Alpha200 8-inch manual probe station offers enhanced versatility for testing larger semiconductor devices, precise manual control for accurate probe placement, and a robust design that accommodates various testing environments, making it ideal for both research and development applications.

AKD-1000 Dynamic Power Device Analyzer - Double Pulsed Tester

Alpha300 12-inch manual probe station offers the advantage of handling larger semiconductor wafers with precise manual control for optimal probe placement, facilitating accurate electrical testing and characterization in research and development environments.

IC Touch
Temperature change test platform after packaging
Can do temperature change test for the chip after packaging
Temperature range -40 ~ 150°C
Can customized variable temperature head for IC packaging

Japan APOLLOWAVE WAT Probe Card (low leakage high and low temperature electrical)
Suitable for semi automated probe station or fully automated probe station

Japan APOLLOWAVE RF Probe Card
Probe card for RF / DC / PCM / WLR measurement

AP-200 8-inch semi-automated probe station features motorized stage movement for precise alignment, programmable testing capabilities for efficient workflows, high-resolution optical viewing systems and the ability to accommodate up to 8-inch wafers.

A zoom type microscope provides continuous magnification, high-resolution optics, a wide zoom range with a large working distance for versatile and precise observation of wafers without lens changes.

A stereo microscope offers a wide field of view, a long working distance, and allows for comfortable binocular viewing through the lens barrel for enhanced depth perception.