Agilent

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    Keysight B1500A Semiconductor Device Parameter Analyzer

    The B1500A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
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    Keysight B1505A Power Device Analyzer

    The B1505A is a Curve Tracer from Agilent. A curve tracer, or curve checker, is a type of electronic test equipment engineers use to analyze semiconductor device characteristics. Curve tracers contain current and voltage sources to stimulate the equipment under test (EUT). A curve tracer applies a swept voltage to two terminals of the EUT, measuring the level of current flowing at each voltage.
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    4155C Agilent Semiconductor Parameter Analyzer

    The 4155C is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
    Calibrations
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    4284A Agilent LCR Meter

    The 4284A is a 1 MHz LCR Meter from Agilent. An LCR meter is a piece of electronic test equipment that measures inductance (L), capacitance (C), and resistance (R) of electronic components. The LCR meter accurately measures these elements on an electronic device, usually one subjected to an alternating current (AC) voltage source. The LCR meter measures the current through and voltage across the device under test.