Key Features of Laboratory Measurement Services
High-Voltage and High-Current Testing
Capability to test devices under high voltage and high current conditions
Advanced Measurement Equipment
Equipped with state-of-the-art instrumentation for precise voltage, current, power and thermal measurements
Thermal Management Systems
Integrated heating and cooling systems for managing heat generation and dissipation during high-power device testing
Manual and Semi-automated Testing Platforms
Handling repetitive tests, ensuring accuracy, efficiency and reduced human error
Customizable Testing Environments
Ability to simulate various environmental conditions such as high temperature or vacuum for stress testing
ESD and EMI Protection
Systems to protect devices and equipment from electrostatic discharge (ESD) and electromagnetic interference (EMI)
Safety Protocols
Robust safety measures and shielding to ensure the safety of operators during high-power testing
Data Acquisition and Reporting
High-speed data logging systems to capture and analyze performance data in real-time, detailed reporting capabilities
Professional engineers assist with measurements
Professional engineers provide measurement assistance, ensuring correct procedures are followed and sample confidentiality is fully protected
Advanced Equipments / Available Measurement Capabilities
KEYSIGHT B1505A
Power Device Analyzer / Curve Tracer
APOLLOWAVE α100
Manual Probe Station - 4inch
SJD AKS-200
Semi-automatic Probe Station - 8inch
KEYSIGHT B1505A
APOLLOWAVE α100 Manual Probe Station - 4inch
Key Features
- 4 inch Manual Probe System with for accurate and reliable IV/CV, RF and measurements
- A compact prober which corresponds to the wafer size up to 4 inch
- User-friendly design
Specifications
- With XY coarse movement and fine adjustment using micrometer that can be quickly positioned by airbearing design, reliable alignment is possible
- Z movement of the platen has coarse movement that can be operated with a lever, and fine movementthat can be adjusted with micrometer
- Trinocular microscope
- Zoom micro CCD camera
Applications
- Low level IV(fA)
- Low level CV(fF)
- RF measurement
- Various resistance measurements such as sheetresistance
- Temperature characteristic test
SJD AKS-200 Semi-automatic Probe Station - 8inch
Key Features
- Precision 4 axis wafer stage for 200mm wafers
- Accommodate the high power measurement 3kV and 200A
- Offers precise control over the positioning of probe sets, enabling accuratemeasurements and testing of semiconductor devices
- Advanced software integration and intuitive user interface can easily navigate through functions and settings
Specifications
- Equipped with integrated controller, microscope, computer and dual monitor
- Broad magnification range and Zoom 0.7~4.5X and 2 megapixel full color CCD camera with autofocus
- Two safety interlock system devices ensure operator safety during measurement
- Leveraging the GPIB interface for instrument communication and testing automation
Applications
- Able to complete accurate Rds (on) measurement at high current
- Used for IV/CV/RF measurement and accommodate the pulse IV measurement system
- Accommodates various types of semiconductor devices, including ICs, MEMS devices and more
If you have devices that need measurement and are interested in the measurement services our laboratory offers, please feel free to contact us to schedule a service. We will get back to you promptly with an evaluation and quotation.
AKD-100 Dynamic Power Device Analyzer - Double Pulsed Tester
AKD-1000 Dynamic Power Device Analyzer is a versatile and dependable tool, capable of accurately assessing a device's response to varying loads operation. Its innovative design and robust capabilities enable the precise and repeatable testing necessary to drive innovation and ensure the quality and dependability of power semiconductor devices. The dynamic measurement service of AKD-1000 will be launched soon. If you are interested, please contact us for more information.